Capabilities
What VisionOS does
Real-Time Defect Detection
Frame-by-frame inspection at line speed. Detects fabric tears, seam defects, colour inconsistencies, and foreign objects without slowing production.
Edge-Native Inference
Runs entirely on-premises on industrial GPU hardware. No cloud dependency, no data egress, no latency spikes. Air-gapped deployment supported.
Worker Safety Monitoring
Detects PPE compliance, restricted zone violations, and ergonomic risk postures in real time — before incidents occur.
Expandable Model Library
Start with garment defect detection. Add CCTV intelligence, perimeter monitoring, or custom inspection models without replacing infrastructure.
Sub-50ms Latency
Designed for real-time manufacturing environments. Inference completes within a single production cycle — no delayed alerting.
Production Analytics
Every inspection event is logged. Track defect rates, throughput, shift performance, and quality trends across time.
Use Cases
Deployment scenarios
Garment Defect Detection
LiveDetects stitching defects, fabric tears, colour inconsistencies, and foreign object contamination at line speed in garment manufacturing.
- Industrial camera array
- Edge GPU node
- Defect classification
- Defect coordinates
- Severity score
- Production halt signal
Worker Safety & PPE Compliance
LiveContinuously monitors worker zones for PPE usage, restricted area entry, and posture risk — escalating violations in real time.
- CCTV cameras
- Zone configuration
- PPE compliance rate
- Violation alerts
- Incident pre-warnings
- Shift safety report
CCTV Intelligence
RoadmapTransforms passive camera networks into active intelligence systems — detecting behaviour anomalies, crowd density, and access violations.
- Existing CCTV infrastructure
- Behaviour anomaly alerts
- Access violation flags
- Crowd density maps
Production Throughput Monitoring
RoadmapVisual tracking of production line throughput, bottleneck detection, and OEE contribution from camera data.
- Production line cameras
- Real-time throughput
- Bottleneck identification
- OEE contribution